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TESCAN TENSOR

TESCAN Shines at APMC13 Brisbane 2025: Unveiling Innovations in Microscopy

TESCAN Group is proud to participate once again in the 13th Asia Pacific Microscopy Congress (APMC13) held in Brisbane from February 2-7, 2025. Our team will be at booth #1, ready to demonstrate our latest advancements in microscopy technology that...

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Figure 1: (a) Virtual bright field (BF) STEM image of the pristine NCM811 primary particles before charging. (b, c) Phase and orientation map for cathode particles shown in (a).
4D-STEM Phase mapping TESCAN TENSOR Material Science energy storage Battery research Strain analysis Cathode stability Microstructural analysis Ni-rich cathode materials Lithium-ion batteries Precession-assisted 4D-STEM

4D-STEM Analysis of Ni-Rich Layered Cathode Materials with TESCAN TENSOR

Unlock New Perspectives in Cathode Material Analysis

To advance battery performance, researchers need to look deeper into the structural characteristics of Ni-rich cathodes. TESCAN, in partnership with the Ernst Ruska Center, has published a new...

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Materials Science 4D-STEM Phase mapping Orientation Analysis TESCAN TENSOR Microscopy BGO electron diffraction ACOM-TEM STEM TEM nanotechnology aluminum

Phase and Orientation Analysis of Bismuth Germanium Oxide (BGO) on Evaporated Aluminum

Crystallographic texture plays a pivotal role in materials science, significantly enhancing the functional properties of polycrystalline materials in engineering applications. Leveraging the advanced capabilities of the TESCAN TENSOR, we conducted a...

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TESCAN TENSOR Strain Measurement
Materials Science TESCAN TENSOR strain measurement nanobeam electron diffraction (NBED) precession electron diffraction (PED) semiconductor devices energy storage materials characterization

Strain Measurement with TESCAN TENSOR

Strain measurementis one of the key capabilities of TESCAN TENSOR, a scanning transmission electron microscope (STEM) designed for advanced materials characterization. Utilizing the 4D-STEM technique enhanced by beam precession, enables the...

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4D-STEM Transmission electron microscopy (TEM) TESCAN TENSOR automated microscopy Electron Microscopy Innovations Materials Science Research Strain Mapping Crystallographic Analysis Advanced Microscopy Techniques

White Paper: In-depth exploration of the TESCAN TENSOR

Welcome to our in-depth exploration of TESCAN TENSOR, a ground-breaking instrument in the world of transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM).

Inside This White Paper:

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Electron Microscopy TESCAN TENSOR zone axis alignment STEM imaging diffraction pattern automated alignments piezo stage TEM instruments Eucentric height microscopy automation STEM diffraction

TESCAN TENSOR: Fully Automated Zone Axis Alignment

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4D-STEM Thermoelectric Ceramics Phase Analysis Orientation Analysis 3DED TESCAN TENSOR Nanomaterials Material Science

Unlock the Potential of TESCAN TENSOR: 4D-STEM Microscopy Combined with 3D ED Tomography for Advanced Material Analysis

TESCAN TENSOR, a multimodal analytical 4D-STEM microscope, enables detailed analysis of micro- and nano-scale domains in heterogeneous materials. It combines electron diffraction tomography (3DED) and electron diffraction mapping (4D-STEM) to determine...

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