A Stem that is as

Easy to use as SEM



A New Generation
of TEM User Experience

Asset 4



Simple. Fast. Interface becomes Experience. 


Traditionally, the user experience with transmission electron microscopes starts with a lengthy set of optical adjustments and alignments, setting up optical properties for each measurement, BEFORE you get to acquire your data.

Not with TESCAN TENSOR. As each measurement is selected, the system automatically adjusts and aligns the optics for you. You are immediately ready to acquire data from your sample. 

This novel approach to STEM usability is the result of combining Expert Systems Automation and User Experience Design, two competencies well represented by the TESCAN Brno-based R&D team, and JK Weiss and his R&D group at TESCAN Tempe.

Learn more about TENSOR’s design concepts HERE

TESCAN TENSOR lets you interact with the sample, not the optics.

By reinventing the User Experience, and automating unproductive tasks, TESCAN TENSOR increases productivity and potentially utilization, which supports the return on investment. 

Examples of highly automated instrument setup routines

Simple, fast ROI Screening and Selection.


Quickly screen and select regions of interests (ROIs) from a large, up to 2x2mm, digital overview image. Image tiles are acquired automatically at the beginning of each work session, without changing the microscope illumination mode, leveraging class-leading field of view at low STEM imaging magnifications. A benefit of this implementation is that samples are not exposed to unnecessary electron dose for in-session navigation purposes, as the overview image is acquired only once.

Choose freely and quickly between Precession ON or OFF.

Optical parameters are automatically adjusted when switching between measurements, including e.g., beam current, beam convergence angle and camera length. No in-depth training is required for notoriously difficult column adjustment and alignment routines, allowing users to spend their time interacting with the specimen, not the optics. Other setups, such as electron beam precession, can simply be switched on or off, with user input into parameters such as precession angle and fine-tuning precession pivot point, which is possible thanks to the very high precession frequency.

Tilt to a zone axis.

Automation further aids users in complicated in-session tasks, including tilting the specimen to a zone axis selected by the user, for measurements such as strain, or imaging of defects such as stacking faults and dislocations.


TESCAN TENSOR also excels in the wide range of STEM, 4D-STEM and Tomography measurements integrated in the system, and stand-out performance from a system designed from the ground up. Explore by clicking any of the links below.


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TESCAN TENSOR and other solutions from TESCAN.