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4D-STEM TESCAN TENSOR Materials Science Phase mapping Electron Microscopy Material Science Material characterization Orientation Analysis Transmission electron microscopy (TEM) energy storage 3DED 4D-STEM Analysis ACOM-TEM Advanced Microscopy Techniques BGO BLOGPOST Battery research Cathode stability Ceramics Compositional analysis Crystallographic Analysis EDS elemental mapping EDX Electron Detectors Electron Microscopy Innovations Eucentric height High-resolution imaging Lithium-ion batteries Materials Science Research Metallurgy Microscopy Microstructural analysis Nanomaterials Nanoscale Imaging Ni-rich cathode materials Orientation maps Phase Analysis Polycrystalline materials Precession Precession-assisted 4D-STEM STEM STEM Instrumentation STEM TECHNOLOGY STEM diffraction STEM imaging Scanning Transmission Electron Microscopy Semiconductor Industry Semiconductors Specimen Thickness Strain Mapping Strain analysis TEM TEM instruments Tescan Tensor STEM Thermoelectric Ceramics aluminum automated alignments automated microscopy diffraction pattern electron diffraction materials characterization microscopy automation nanobeam electron diffraction (NBED) nanotechnology piezo stage precession electron diffraction (PED) semiconductor devices strain measurement zone axis alignment

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TESCAN GROUP Expands Presence in Asia with New Subsidiaries in Taiwan and Singapore

BRNO - TESCAN GROUP, a global leader in electron microscopy and scientific instrumentation, is proud to announce the establishment of its newest subsidiaries, TESCAN Taiwan and TESCAN Singapore, as part of its strategic expansion in the Asia-Pacific...

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Figure 1: (a) Virtual bright field (BF) STEM image of the pristine NCM811 primary particles before charging. (b, c) Phase and orientation map for cathode particles shown in (a).
4D-STEM Phase mapping TESCAN TENSOR Material Science energy storage Battery research Strain analysis Cathode stability Microstructural analysis Ni-rich cathode materials Lithium-ion batteries Precession-assisted 4D-STEM

4D-STEM Analysis of Ni-Rich Layered Cathode Materials with TESCAN TENSOR

Unlock New Perspectives in Cathode Material Analysis

To advance battery performance, researchers need to look deeper into the structural characteristics of Ni-rich cathodes. TESCAN, in partnership with the Ernst Ruska Center, has published a new...

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Materials Science 4D-STEM Phase mapping Orientation Analysis TESCAN TENSOR Microscopy BGO electron diffraction ACOM-TEM STEM TEM nanotechnology aluminum

Phase and Orientation Analysis of Bismuth Germanium Oxide (BGO) on Evaporated Aluminum

Crystallographic texture plays a pivotal role in materials science, significantly enhancing the functional properties of polycrystalline materials in engineering applications. Leveraging the advanced capabilities of the TESCAN TENSOR, we conducted a...

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TESCAN TENSOR Strain Measurement
Materials Science TESCAN TENSOR strain measurement nanobeam electron diffraction (NBED) precession electron diffraction (PED) semiconductor devices energy storage materials characterization

Strain Measurement with TESCAN TENSOR

Strain measurementis one of the key capabilities of TESCAN TENSOR, a scanning transmission electron microscope (STEM) designed for advanced materials characterization. Utilizing the 4D-STEM technique enhanced by beam precession, enables the...

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4D-STEM Transmission electron microscopy (TEM) TESCAN TENSOR automated microscopy Electron Microscopy Innovations Materials Science Research Strain Mapping Crystallographic Analysis Advanced Microscopy Techniques

White Paper: In-depth exploration of the TESCAN TENSOR

Welcome to our in-depth exploration of TESCAN TENSOR, a ground-breaking instrument in the world of transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM).

Inside This White Paper:

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Electron Microscopy TESCAN TENSOR zone axis alignment STEM imaging diffraction pattern automated alignments piezo stage TEM instruments Eucentric height microscopy automation STEM diffraction

TESCAN TENSOR: Fully Automated Zone Axis Alignment

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TESCAN at M&M 2024: Join Us for the Launch of AMBER 2!

TESCAN is excited to announce our participation in the Microscopy & Microanalysis (M&M) 2024 conference, taking place from July 29 to August 1 in Cleveland, Ohio, USA.

This esteemed event is a key gathering for experts in microscopy and microanalysis,...

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4D-STEM Thermoelectric Ceramics Phase Analysis Orientation Analysis 3DED TESCAN TENSOR Nanomaterials Material Science

Unlock the Potential of TESCAN TENSOR: 4D-STEM Microscopy Combined with 3D ED Tomography for Advanced Material Analysis

TESCAN TENSOR, a multimodal analytical 4D-STEM microscope, enables detailed analysis of micro- and nano-scale domains in heterogeneous materials. It combines electron diffraction tomography (3DED) and electron diffraction mapping (4D-STEM) to determine...

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4D-STEM Tescan Tensor STEM Material characterization Compositional analysis EDS elemental mapping Transmission electron microscopy (TEM) High-resolution imaging

Unveiling the Power of Elemental Analysis at Nanoscale with TESCAN TENSOR

Uncover the Secrets of Your Materials with TESCAN TENSOR

TESCAN TENSOR redefines the possibilities of elemental analysis at the nanoscale. This advanced analytical 4D-STEM simplifies the process of acquiring and interpreting EDS data, empowering you to...

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Semiconductors 4D-STEM Electron Microscopy Material characterization Phase mapping Polycrystalline materials Ceramics EDX Metallurgy

TENSOR | Unveiling the Nano-World with Precision and Clarity 

TESCAN GROUP proudly presents a breakthrough in nanoscale analysis: the integration of precession-assisted 4D-STEM phase and orientation mapping with synchronized EDX signals on our TESCAN TENSOR. This innovative approach, spearheaded by our experts,...

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