Pioneering Perspectives in Material Sciences

TESCAN Insights

Explore the FIB-SEM technologies and their practical applications within material sciences through our expert insights.

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DOWNLOAD TESCAN AMBER X Flyer

We have some exciting news from the world of scientific instrumentation. The launch of the next generation of our highly acclaimed AMBER platform is imminent: TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor...

Tired of wrestling with limitations in large sample analysis?We get it. The milling rate of traditional Ga+ FIB-SEM is not sufficient for today’s challenges in materials science. But what if you could unlock nanometer-resolution insights across...

Back by Popular Demand: Dive Deeper into Material Sciences with TESCAN's Expert-Led Webinar

Following a spike of interest from our previous session, we are pleased to announce the return of our last year’s seminar on Plasma FIB-SEM for Multi-modal Materials Characterization. Join us for an engaging session and a live Q&A where our experts will...

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